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The book explains the operating principles of atomic force microscopy to enable readers to operate a scanning probe microscope successfully and to understand the data obtained. The chapters on the scanning probe techniques are complemented by chapters on fundamentals and important technical aspects. This book is primarily intended for graduate students in physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.
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NanoScience and Technology: Atomic Force Microscopy, Bert Voigtländer
- Langue
- Année de publication
- 2019
- Reliure
- (rigide)
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- Titre
- NanoScience and Technology: Atomic Force Microscopy
- Sous-titre
- Second Edition
- Langue
- Anglais
- Auteurs
- Bert Voigtländer
- Éditeur
- Springer
- Publié
- 2019
- Format
- rigide
- Pages
- 345
- ISBN10
- 3030136531
- ISBN13
- 9783030136536
- Séries
- Mots clés
- Nonfiction, Science et Mathématiques, Sciences naturelles, Biologie, Science, Technologie, Physique, Chimie, Écrits rassemblés, Électronique, Expériences (science), Mécanique, Chimie physique, Nanotechnologie, Biophysique
- Évaluation
- 5 sur 5
- Description
- The book explains the operating principles of atomic force microscopy to enable readers to operate a scanning probe microscope successfully and to understand the data obtained. The chapters on the scanning probe techniques are complemented by chapters on fundamentals and important technical aspects. This book is primarily intended for graduate students in physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.