Electron microscopy

Derived from the successful three-volume Handbook of Microscopy, this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the characterization of surfaces offers a competent comparison of the feasibilities of the latest developments in this field of research.Topics * Stationary Beam Transmission Electron Microscopy/ Electron Energy Loss Spectroscopy/ Convergent Electron Beam Diffraction/ Low Energy Electron Microscopy/ Electron Holographic Methods* Scanning Beam Scanning Transmission Electron Microscopy/ Scanning Auger and XPS Microscopy/ Scanning Microanalysis/ Imaging Secondary Ion Mass Spectrometry* Magnetic Scanning Electron Microscopy with Polarization Analysis/ Spin Polarized Low Energy Electron MicroscopyMaterials scientists as well as any surface scientist will find this book an invaluable source of information for the principles of electron microscopy.