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Focusing on electromigration, the book explores its impact on the reliability of electronic circuits. It details the physical processes involved, equipping readers with the knowledge needed to implement effective countermeasures. A variety of strategies for adapting current integrated circuit design methodologies to mitigate electromigration are presented. Additionally, the authors demonstrate how certain effects can be harnessed in existing and emerging technologies to minimize the detrimental effects on circuit reliability.
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Fundamentals of Electromigration-Aware Integrated Circuit Design, Jens Lienig, Matthias Thiele
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- Année de publication
- 2018
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