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- 558pages
- 20 heures de lecture
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Surveying and comparing all techniques relevant for practical applications, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. Completely revised and updated, sections include electron, ion and photon detection, as well as scanning microscopy, while new chapters have been added to cover such recently developed techniques as SNOM, SERS, and laser ablation. Over 500 references and a list of equipment suppliers make this a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry.
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Surface and Thin Film Analysis, Gernot Friedbacher, Henning Bubert
- Langue
- Année de publication
- 2011
- product-detail.submit-box.info.binding
- (rigide)
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- Titre
- Surface and Thin Film Analysis
- Sous-titre
- A Compendium of Principles, Instrumentation, and Applications - Second, Completely Revised and Enlarged Edition
- Langue
- Anglais
- Auteurs
- Gernot Friedbacher, Henning Bubert
- Éditeur
- Wiley-VCH
- Publié
- 2011
- Format
- rigide
- Pages
- 558
- ISBN10
- 3527320474
- ISBN13
- 9783527320479
- Séries
- Mots clés
- Nonfiction, Science et Mathématiques, Sciences naturelles, Manuels et guides, Technologie, Chimie, Guides, Meilleures ventes, Armure, équipement, Applications, Analyse chimique
- Description
- Surveying and comparing all techniques relevant for practical applications, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. Completely revised and updated, sections include electron, ion and photon detection, as well as scanning microscopy, while new chapters have been added to cover such recently developed techniques as SNOM, SERS, and laser ablation. Over 500 references and a list of equipment suppliers make this a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry.